Keyphrases
RF Circuits
100%
Field Monitoring
100%
Aging Mechanism
100%
Reliability Enhancement
100%
Aging
50%
Circuit Performance
50%
Design Time
50%
Process Variation
50%
Field Aging
50%
Impact Performance
50%
Performance Degradation
50%
Device Level
50%
Mitigation Techniques
50%
Simulation-based
50%
Monitoring Method
50%
Specification Process
50%
Stress Conditions
50%
Aging Model
50%
Catastrophic Failure
50%
Performance Parameters
50%
Analog Circuits
50%
MOSFET Device
50%
Use Simulation
50%
Initial Performance
50%
Low Area
50%
LC Oscillator
50%
Continuous Degradation
50%
Degradation Pattern
50%
Engineering
Design Time
100%
Circuit Performance
100%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Performance Degradation
100%
Catastrophic Failure
100%
Stress Condition
100%
Performance Parameter
100%
Analog Circuit
100%
Oscillator
100%
Hot Spot
100%
Process Variation
100%
Computer Science
Process Variation
100%
Hotspot
100%
Performance Degradation
100%
Performance Impact
100%
Initial Performance
100%
Performance Parameter
100%
Analog Circuit
100%
Catastrophic Failure
100%
Material Science
Electronic Circuit
100%
Analogue Circuit
25%
Metal-Oxide-Semiconductor Field-Effect Transistor
25%