Research output per year
Research output per year
Personal profile
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Dive into the research topics where Sule Ozev is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Global Tuning for System Performance Optimization of RF MIMO Radars
Can Ataman, F., Emir Avci, M., Chethan Kumar, Y. B. & Ozev, S., 2023, Proceedings - 2023 IEEE European Test Symposium, ETS 2023. Institute of Electrical and Electronics Engineers Inc., (Proceedings of the European Test Workshop; vol. 2023-May).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation
Bilgic, B. & Ozev, S., Aug 1 2023, In: IEEE Design and Test. 40, 4, p. 5-16 12 p.Research output: Contribution to journal › Article › peer-review
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Low-Overhead RF Impedance Measurement Using Periodic Structures
Avci, M. E. & Ozev, S., Oct 1 2023, In: IEEE Transactions on Microwave Theory and Techniques. 71, 10, p. 4471-4482 12 p.Research output: Contribution to journal › Article › peer-review
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Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors
Ataman, F. C., Aladsani, M., Trichopoulos, G., Chethan Kumar, Y. B. & Ozev, S., 2023, Proceedings - 2023 IEEE European Test Symposium, ETS 2023. Institute of Electrical and Electronics Engineers Inc., (Proceedings of the European Test Workshop; vol. 2023-May).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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VTS 2023 Foreword
Tahoori, M., Song, P., Ozev, S. & Dworak, J., 2023, In: Proceedings of the IEEE VLSI Test Symposium. 2023-AprilResearch output: Contribution to journal › Editorial › peer-review
Open Access
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Inductive Fault Analysis for Determining Statistical Analog Test Metrics
1/1/23 → 12/31/25
Project: Research project
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Test Development Ecosystem to Ensure Quality and Reliability of Analog Circuits
8/22/22 → 8/21/25
Project: Research project
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Techniques for Low-cost Design, Test, and Calibration of RF MIMO Systems
1/1/22 → 12/31/24
Project: Research project
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Defect Based Analog Circuit Diagnosis and Yield Enhancement (ASUF 30005817)
5/1/13 → 4/30/25
Project: Research project
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