Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation

Bora Bilgic; Sule Ozev

doi:10.1109/MDAT.2023.3266997

Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation

Bora Bilgic, Sule Ozev

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Editor's notes: Analog circuits enhanced with digital circuitry are vulnerable to changes in circuit structure or configuration that arise from natural sources (defects) or unnatural sources (malicious attacks). This article explores the use of in-field circuit monitors to measure the changes in circuit performance that can indicate such a change with low overhead and without compromising the security of the circuit.

Original language	English (US)
Pages (from-to)	5-16
Number of pages	12
Journal	IEEE Design and Test
Volume	40
Issue number	4
DOIs	https://doi.org/10.1109/MDAT.2023.3266997
State	Published - Aug 1 2023
Externally published	Yes

Keywords

analog
degradation
detection
filter
locking
low drop out
monitoring
performance
security

ASJC Scopus subject areas

Software
Electrical and Electronic Engineering
Hardware and Architecture

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10.1109/MDAT.2023.3266997

Cite this

@article{fb7a7a8719b44359b3e0a1e8a8ff6b29,

title = "Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation",

abstract = "Editor's notes: Analog circuits enhanced with digital circuitry are vulnerable to changes in circuit structure or configuration that arise from natural sources (defects) or unnatural sources (malicious attacks). This article explores the use of in-field circuit monitors to measure the changes in circuit performance that can indicate such a change with low overhead and without compromising the security of the circuit.",

keywords = "analog, degradation, detection, filter, locking, low drop out, monitoring, performance, security",

author = "Bora Bilgic and Sule Ozev",

note = "Publisher Copyright: {\textcopyright} 2013 IEEE.",

year = "2023",

month = aug,

day = "1",

doi = "10.1109/MDAT.2023.3266997",

language = "English (US)",

volume = "40",

pages = "5--16",

journal = "IEEE Design and Test",

issn = "2168-2356",

publisher = "IEEE Computer Society",

number = "4",

}

TY - JOUR

T1 - Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation

AU - Bilgic, Bora

AU - Ozev, Sule

PY - 2023/8/1

Y1 - 2023/8/1

N2 - Editor's notes: Analog circuits enhanced with digital circuitry are vulnerable to changes in circuit structure or configuration that arise from natural sources (defects) or unnatural sources (malicious attacks). This article explores the use of in-field circuit monitors to measure the changes in circuit performance that can indicate such a change with low overhead and without compromising the security of the circuit.

AB - Editor's notes: Analog circuits enhanced with digital circuitry are vulnerable to changes in circuit structure or configuration that arise from natural sources (defects) or unnatural sources (malicious attacks). This article explores the use of in-field circuit monitors to measure the changes in circuit performance that can indicate such a change with low overhead and without compromising the security of the circuit.

KW - analog

KW - degradation

KW - detection

KW - filter

KW - locking

KW - low drop out

KW - monitoring

KW - performance

KW - security

UR - http://www.scopus.com/inward/record.url?scp=85153485022&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85153485022&partnerID=8YFLogxK

U2 - 10.1109/MDAT.2023.3266997

DO - 10.1109/MDAT.2023.3266997

M3 - Article

AN - SCOPUS:85153485022

SN - 2168-2356

VL - 40

SP - 5

EP - 16

JO - IEEE Design and Test

JF - IEEE Design and Test

IS - 4

ER -

Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation

Abstract

Keywords

ASJC Scopus subject areas

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