A Low Cost Physical Stimulus Emulator for Motion and Pressure Sensors

Ishaan Bassi, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The presented method outlines a low-cost rotating test platform for calibrating and measuring the sensitivity of accelerometers. Traditionally, accelerometers are tested and calibrated using heavy-duty shaking devices, which involve numerous cables and are challenging to maintain. This method leverages the centripetal force generated by the rotating platform to apply a fixed acceleration at set revolutions per minute (RPM). A major advantage of this innovation is the use of wireless technology to transfer the accelerometer data to a computer, eliminating the need for lengthy cables. The rotating platform can generate different accelerations at varying distances along the radius by spinning at different RPMs. The proposed method employs a circular platform that rotates in a controlled manner using a motor at desired RPMs. The output voltage from the accelerometer is read using a microcontroller and sent wirelessly to a computer for further analysis. The collected data can be processed to determine the accelerometer's sensitivity, and the proposed method can test multiple sensors simultaneously.

Original languageEnglish (US)
Title of host publication2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages322-325
Number of pages4
ISBN (Electronic)9798350302103
DOIs
StatePublished - 2023
Externally publishedYes
Event2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023 - Tempe, United States
Duration: Aug 6 2023Aug 9 2023

Publication series

NameMidwest Symposium on Circuits and Systems
ISSN (Print)1548-3746

Conference

Conference2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023
Country/TerritoryUnited States
CityTempe
Period8/6/238/9/23

Keywords

  • accelerometers
  • calibration
  • MEMS
  • sensors
  • testing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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