Abstract
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in safety-critical biomedical applications, dependability emerges as a critical performance parameter. In this paper, we present a cost-effective concurrent test methodology for droplet-based microelectrofluidic systems. We present a classification of catastrophic and parametric faults in such systems and show how faults can be detected by electrostatically controlling and tracking droplet motion. We then present tolerance analysis based on Monte-Carlo simulations to characterize the impact of parameter variations on system performance. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for droplet-based microelectrofluidic systems.
Original language | English (US) |
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Title of host publication | IEEE International Test Conference (TC) |
Pages | 1192-1200 |
Number of pages | 9 |
State | Published - 2003 |
Externally published | Yes |
Event | Proceedings International Test Conference 2003 - Charlotte, NC, United States Duration: Sep 30 2003 → Oct 2 2003 |
Other
Other | Proceedings International Test Conference 2003 |
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Country/Territory | United States |
City | Charlotte, NC |
Period | 9/30/03 → 10/2/03 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Hardware and Architecture