Testing of Droplet-Based Microelectrofluidic Systems

Fei Su, Sule Ozev, Krishnendu Chakrabarty

Research output: Chapter in Book/Report/Conference proceedingConference contribution

86 Scopus citations


Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in safety-critical biomedical applications, dependability emerges as a critical performance parameter. In this paper, we present a cost-effective concurrent test methodology for droplet-based microelectrofluidic systems. We present a classification of catastrophic and parametric faults in such systems and show how faults can be detected by electrostatically controlling and tracking droplet motion. We then present tolerance analysis based on Monte-Carlo simulations to characterize the impact of parameter variations on system performance. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for droplet-based microelectrofluidic systems.

Original languageEnglish (US)
Title of host publicationIEEE International Test Conference (TC)
Number of pages9
StatePublished - 2003
Externally publishedYes
EventProceedings International Test Conference 2003 - Charlotte, NC, United States
Duration: Sep 30 2003Oct 2 2003


OtherProceedings International Test Conference 2003
Country/TerritoryUnited States
CityCharlotte, NC

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Hardware and Architecture


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