Statistical library characterization using arbitrary polynomial chaos

Mehmet Ince; Sule Ozev; Sarma Vrudhula

doi:10.1109/LASCAS.2017.7948078

Statistical library characterization using arbitrary polynomial chaos

Mehmet Ince, Sule Ozev, Sarma Vrudhula

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

The method of arbitrary polynomial chaos (aPC) is used to characterize the delay and subthreshold leakage of commercial 65nm and 28nm standard cell libraries. Delay and subthreshold leakage of a standard cell are modelled as orthogonal polynomial series of process variables. The aPC approach constructs the polynomials using only moments, and the coefficients of the polynomials are determined by minimum least squares, using samples generated by Monte Carlo simulation (MCS). The mean and standard deviation of delay and subthreshold leakage computed using aPC are within 1% of those computed using MCS while the aPC method results in a 25X-40X speed up over MCS.

Original language	English (US)
Title of host publication	LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference
Subtitle of host publication	Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509058594
DOIs	https://doi.org/10.1109/LASCAS.2017.7948078
State	Published - Jun 13 2017
Event	8th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2017 - Bariloche, Argentina Duration: Feb 20 2017 → Feb 23 2017

Publication series

Name	LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings

Other

Other	8th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2017
Country/Territory	Argentina
City	Bariloche
Period	2/20/17 → 2/23/17

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/LASCAS.2017.7948078

Cite this

Ince, M., Ozev, S., & Vrudhula, S. (2017). Statistical library characterization using arbitrary polynomial chaos. In LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings Article 7948078 (LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LASCAS.2017.7948078

Statistical library characterization using arbitrary polynomial chaos. / Ince, Mehmet; Ozev, Sule ; Vrudhula, Sarma.
LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. 7948078 (LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ince, M, Ozev, S & Vrudhula, S 2017, Statistical library characterization using arbitrary polynomial chaos. in LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings., 7948078, LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings, Institute of Electrical and Electronics Engineers Inc., 8th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2017, Bariloche, Argentina, 2/20/17. https://doi.org/10.1109/LASCAS.2017.7948078

Ince M, Ozev S , Vrudhula S. Statistical library characterization using arbitrary polynomial chaos. In LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. 7948078. (LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings). doi: 10.1109/LASCAS.2017.7948078

Ince, Mehmet ; Ozev, Sule ; Vrudhula, Sarma. / Statistical library characterization using arbitrary polynomial chaos. LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. (LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings).

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abstract = "The method of arbitrary polynomial chaos (aPC) is used to characterize the delay and subthreshold leakage of commercial 65nm and 28nm standard cell libraries. Delay and subthreshold leakage of a standard cell are modelled as orthogonal polynomial series of process variables. The aPC approach constructs the polynomials using only moments, and the coefficients of the polynomials are determined by minimum least squares, using samples generated by Monte Carlo simulation (MCS). The mean and standard deviation of delay and subthreshold leakage computed using aPC are within 1% of those computed using MCS while the aPC method results in a 25X-40X speed up over MCS.",

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AB - The method of arbitrary polynomial chaos (aPC) is used to characterize the delay and subthreshold leakage of commercial 65nm and 28nm standard cell libraries. Delay and subthreshold leakage of a standard cell are modelled as orthogonal polynomial series of process variables. The aPC approach constructs the polynomials using only moments, and the coefficients of the polynomials are determined by minimum least squares, using samples generated by Monte Carlo simulation (MCS). The mean and standard deviation of delay and subthreshold leakage computed using aPC are within 1% of those computed using MCS while the aPC method results in a 25X-40X speed up over MCS.

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Statistical library characterization using arbitrary polynomial chaos

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