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Single-Event Gate Rupture Hardened Structure for High-Voltage Super-Junction Power MOSFETs
K. Muthuseenu, H. J. Barnaby, K. F. Galloway, A. E. Koziukov, T. A. Maksimenko, M. Y. Vyrostkov, K. B. Bu-Khasan, A. A. Kalashnikova, A. Privat
Research output: Contribution to journal › Article › peer-review
11
Scopus
citations