RF circuit authentication for detection of process Trojans

Fatih Karabacak, Richard Welker, Matthew J. Casto, Jennifer Kitchen, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations


Globalized supply chain for electronic circuit manufacturing has reduced the production cost considerably. However, it also presents a challenge since many companies/players contribute to the product and it is not always possible to control or monitor every third-party employee or contractor that takes part in the process. A design house that relies on a foundry for manufacturing needs to ensure that the manufactured devices conform to the agreed-upon process model between the design house and the foundry. Potential deviation from the process model may be due to incidental quality control issues, or due to malicious modifications to the process or circuit layout with the intent of doing harm during in-field operation. In this paper, we present a multivariate methodology to detect even small process and layout level modifications to the circuit by using mission-mode specifications as well as enhanced test modes. We present an algorithm for detecting process/layout modifications and for selection of test inputs to be used in the detection process. Experimental results on an LNA circuit show that the proposed technique can achieve high authentication accuracy even for a single device with a negligible false positive rate.

Original languageEnglish (US)
Title of host publicationProceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)9781538637746
StatePublished - May 29 2018
Event36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States
Duration: Apr 22 2018Apr 25 2018

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Other36th IEEE VLSI Test Symposium, VTS 2018
Country/TerritoryUnited States
CitySan Francisco

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering


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