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Resistance State Locking in CBRAM Cells Due to Displacement Damage Effects
J. L. Taggart, R. Fang, Yago Gonzalez Velo, Hugh Barnaby, Michael Kozicki, J. L. Pacheco, E. S. Bielejec, M. L. McLain, N. Chamele, A. Mahmud, M. Mitkova
- Connection One (C1)
- Electrical Engineering
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Embedded Systems, Consortium for (CES)
- Applied Nanoionics, Center for (CANi)
- Solid State Electronics Research Center (CSSER)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Materials Science and Engineering
- Nano-Electronics, Arizona Institute of (AINE)
- Knowledge Enterprise (KE)
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations