Recent developments in low-voltage SEM of polymers

Stephen Krause, W. W. Adams

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The development of low voltage scanning electron microscopy (LVSEM) has been driven by improved instrumentation and in particular, reliable field emission gun (FEG) SEMs. The usefulness of LVSEM has also grown because of an improved theoretical and experimental understanding of samble-beam interactions and by advances in sample preparation and operating techniques. In this study, progress in polymer LVSEM is reviewed and recent results and developments in the field are presented.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993


OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA

ASJC Scopus subject areas

  • General Engineering


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