Online information utility assessment for per-device adaptive test flow

Yanjun Li; Ender Yilmaz; Peter Sarson; Sule Ozev

doi:10.1109/VTS.2018.8368662

Online information utility assessment for per-device adaptive test flow

Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Per-device adaptive test is a promising direction with the best trade-off between test quality and test time so far. In this work, we propose a method for online assessment of the information content of the next test in the test queue. This assessment can be used to tune the trade-off between test quality and test time of a per-device adaptive test. Since majority of specification parameters are correlated, the overall information content of multiple tests is difficult to extract. We model multi-variate correlations among specification parameters and take these correlations into account to estimate the multivariate overall information utility of a given set of tests. The proposed method can be integrated within an existing adaptive test flow (per-device or per-wafer) that runs in the background. Experimental results using 3 distinct industry circuits and sizable data show that the proposed technique can finely tune the trade-off, even achieve zero test escape rates with appreciable test time savings.

Original language	English (US)
Title of host publication	Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
Publisher	IEEE Computer Society
Pages	1-6
Number of pages	6
ISBN (Electronic)	9781538637746
DOIs	https://doi.org/10.1109/VTS.2018.8368662
State	Published - May 29 2018
Event	36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States Duration: Apr 22 2018 → Apr 25 2018

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium
Volume	2018-April

Other

Other	36th IEEE VLSI Test Symposium, VTS 2018
Country/Territory	United States
City	San Francisco
Period	4/22/18 → 4/25/18

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTS.2018.8368662

Cite this

Online information utility assessment for per-device adaptive test flow. / Li, Yanjun; Yilmaz, Ender; Sarson, Peter et al.
Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. IEEE Computer Society, 2018. p. 1-6 (Proceedings of the IEEE VLSI Test Symposium; Vol. 2018-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Li, Y, Yilmaz, E, Sarson, P & Ozev, S 2018, Online information utility assessment for per-device adaptive test flow. in Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Proceedings of the IEEE VLSI Test Symposium, vol. 2018-April, IEEE Computer Society, pp. 1-6, 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, United States, 4/22/18. https://doi.org/10.1109/VTS.2018.8368662

@inproceedings{3558c067297944dc822726acbde50509,

title = "Online information utility assessment for per-device adaptive test flow",

abstract = "Per-device adaptive test is a promising direction with the best trade-off between test quality and test time so far. In this work, we propose a method for online assessment of the information content of the next test in the test queue. This assessment can be used to tune the trade-off between test quality and test time of a per-device adaptive test. Since majority of specification parameters are correlated, the overall information content of multiple tests is difficult to extract. We model multi-variate correlations among specification parameters and take these correlations into account to estimate the multivariate overall information utility of a given set of tests. The proposed method can be integrated within an existing adaptive test flow (per-device or per-wafer) that runs in the background. Experimental results using 3 distinct industry circuits and sizable data show that the proposed technique can finely tune the trade-off, even achieve zero test escape rates with appreciable test time savings.",

author = "Yanjun Li and Ender Yilmaz and Peter Sarson and Sule Ozev",

note = "Funding Information: 1 Project NO. ZYGX2016J220 Supported by Fundamental Research Funds for the Central Universities, China. Publisher Copyright: {\textcopyright} 2018 IEEE.; 36th IEEE VLSI Test Symposium, VTS 2018 ; Conference date: 22-04-2018 Through 25-04-2018",

year = "2018",

month = may,

day = "29",

doi = "10.1109/VTS.2018.8368662",

language = "English (US)",

series = "Proceedings of the IEEE VLSI Test Symposium",

publisher = "IEEE Computer Society",

pages = "1--6",

booktitle = "Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018",

}

TY - GEN

T1 - Online information utility assessment for per-device adaptive test flow

AU - Li, Yanjun

AU - Yilmaz, Ender

AU - Sarson, Peter

AU - Ozev, Sule

PY - 2018/5/29

Y1 - 2018/5/29

N2 - Per-device adaptive test is a promising direction with the best trade-off between test quality and test time so far. In this work, we propose a method for online assessment of the information content of the next test in the test queue. This assessment can be used to tune the trade-off between test quality and test time of a per-device adaptive test. Since majority of specification parameters are correlated, the overall information content of multiple tests is difficult to extract. We model multi-variate correlations among specification parameters and take these correlations into account to estimate the multivariate overall information utility of a given set of tests. The proposed method can be integrated within an existing adaptive test flow (per-device or per-wafer) that runs in the background. Experimental results using 3 distinct industry circuits and sizable data show that the proposed technique can finely tune the trade-off, even achieve zero test escape rates with appreciable test time savings.

AB - Per-device adaptive test is a promising direction with the best trade-off between test quality and test time so far. In this work, we propose a method for online assessment of the information content of the next test in the test queue. This assessment can be used to tune the trade-off between test quality and test time of a per-device adaptive test. Since majority of specification parameters are correlated, the overall information content of multiple tests is difficult to extract. We model multi-variate correlations among specification parameters and take these correlations into account to estimate the multivariate overall information utility of a given set of tests. The proposed method can be integrated within an existing adaptive test flow (per-device or per-wafer) that runs in the background. Experimental results using 3 distinct industry circuits and sizable data show that the proposed technique can finely tune the trade-off, even achieve zero test escape rates with appreciable test time savings.

UR - http://www.scopus.com/inward/record.url?scp=85048356488&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85048356488&partnerID=8YFLogxK

U2 - 10.1109/VTS.2018.8368662

DO - 10.1109/VTS.2018.8368662

M3 - Conference contribution

AN - SCOPUS:85048356488

T3 - Proceedings of the IEEE VLSI Test Symposium

SP - 1

EP - 6

BT - Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018

PB - IEEE Computer Society

T2 - 36th IEEE VLSI Test Symposium, VTS 2018

Y2 - 22 April 2018 through 25 April 2018

ER -

Online information utility assessment for per-device adaptive test flow

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