TY - GEN
T1 - Making unreliable Chem-FET sensors smart via soft calibration
AU - Karabacak, Fatih
AU - Obahiagbon, Uwadiae
AU - Ogras, Umit
AU - Ozev, Sule
AU - Blain Christen, Jennifer
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/5/25
Y1 - 2016/5/25
N2 - Biological and chemical sensor systems have many potentially transformative applications including health care, environmental monitoring, and biological or chemical threat detection. A major impediment in the widespread use of low-cost sensors, such as ChemFETs (Chemically sensitive Field-Effect Transistors), is the degradation in accuracy due to drift which occurs immediately after deployment. This paper presents a fully automated soft-calibration technique that extends the lifetime of sensors by compensating drift. The proposed methodology is applied to pH sensors, which can be manufactured for less than 10 cents. Experimental results show we can achieve very accurate results even if the sensor output has drifted by more than 600%. The proposed technique has been shown to extend the usable time of the ISFET sensor from mere minutes to 8 hours.
AB - Biological and chemical sensor systems have many potentially transformative applications including health care, environmental monitoring, and biological or chemical threat detection. A major impediment in the widespread use of low-cost sensors, such as ChemFETs (Chemically sensitive Field-Effect Transistors), is the degradation in accuracy due to drift which occurs immediately after deployment. This paper presents a fully automated soft-calibration technique that extends the lifetime of sensors by compensating drift. The proposed methodology is applied to pH sensors, which can be manufactured for less than 10 cents. Experimental results show we can achieve very accurate results even if the sensor output has drifted by more than 600%. The proposed technique has been shown to extend the usable time of the ISFET sensor from mere minutes to 8 hours.
UR - http://www.scopus.com/inward/record.url?scp=84973894781&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84973894781&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2016.7479243
DO - 10.1109/ISQED.2016.7479243
M3 - Conference contribution
AN - SCOPUS:84973894781
T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED
SP - 456
EP - 461
BT - Proceedings of the 17th International Symposium on Quality Electronic Design, ISQED 2016
PB - IEEE Computer Society
T2 - 17th International Symposium on Quality Electronic Design, ISQED 2016
Y2 - 15 March 2016 through 16 March 2016
ER -