TY - JOUR
T1 - Low-cost characterization and calibration of RF integrated circuits through I-Q data analysis
AU - Acar, Erkan
AU - Ozev, Sule
N1 - Funding Information:
Manuscript received September 5, 2008; revised November 21, 2008 and January 22, 2009. Current version published June 17, 2009. This work is supported by Semiconductor Research Corporation under contact number 1836.012 and by National Science Foundation under contract 0917766. This paper was recommended by Associate Editor H. E. Graeb. E. Acar was with Duke University, Durham, NC 27708 USA. He is now with Intel Corporation, Hillsboro, OR 97124 USA. S. Ozev is with the Department of Electrical Engineering, Arizona State University, Tempe, AZ 85287 USA. Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TCAD.2009.2020718
PY - 2009/7
Y1 - 2009/7
N2 - Due to the increasing complexity of radio-frequency circuits, their testing becomes more challenging. A large number of performance parameters under several operation conditions are needed in order to ensure compliance to specifications. In this paper, we present a low-cost test methodology that determines significant performance parameters, such as path gain IIP 3, quadrature imbalances, noise, bit error rate, and error vector magnitude through a single test setup. The proposed test methodology is applicable for both single-carrier and multicarrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test setup and using a shorter test sequence than required by traditional techniques. In addition, a calibration technique is presented for single-carrier systems to recover marginally failing devices through analytically correcting performance parameters.
AB - Due to the increasing complexity of radio-frequency circuits, their testing becomes more challenging. A large number of performance parameters under several operation conditions are needed in order to ensure compliance to specifications. In this paper, we present a low-cost test methodology that determines significant performance parameters, such as path gain IIP 3, quadrature imbalances, noise, bit error rate, and error vector magnitude through a single test setup. The proposed test methodology is applicable for both single-carrier and multicarrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test setup and using a shorter test sequence than required by traditional techniques. In addition, a calibration technique is presented for single-carrier systems to recover marginally failing devices through analytically correcting performance parameters.
KW - I-Q calibration
KW - Radio-frequency (RF) testing
KW - WLAN testing
UR - http://www.scopus.com/inward/record.url?scp=67650908122&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=67650908122&partnerID=8YFLogxK
U2 - 10.1109/TCAD.2009.2020718
DO - 10.1109/TCAD.2009.2020718
M3 - Article
AN - SCOPUS:67650908122
SN - 0278-0070
VL - 28
SP - 993
EP - 1005
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IS - 7
M1 - 5075813
ER -