Engineering & Materials Science
Thin films
100%
Bond length
44%
Silicides
41%
Free energy
36%
Surface morphology
33%
X ray absorption spectroscopy
29%
X ray absorption
26%
Metastable phases
24%
Electron guns
23%
Phase stability
21%
Atomic force microscopy
19%
Zirconium
19%
Phase transitions
15%
Evaporation
15%
Annealing
15%
Titanium
14%
Surface roughness
12%
Substrates
10%
Chemical Compounds
Liquid Film
51%
Strain
42%
Surface
33%
Bond Length
25%
Gibbs Free Energy
22%
Phase Stability
18%
Extended X-Ray Absorption Fine Structure
18%
X Ray Absorption Spectroscopy
16%
Surface Roughness
15%
Evaporation
13%
Atomic Force Microscopy
11%
Annealing
11%
Electron Particle
8%
Energy
7%
Physics & Astronomy
thin films
54%
silicides
31%
free energy
24%
electron guns
17%
absorption spectroscopy
13%
x rays
13%
surface roughness
12%
titanium
12%
fine structure
12%
atomic force microscopy
11%
evaporation
11%
annealing
9%
energy
4%