TY - GEN
T1 - Extraction of EVM from transmitter system parameters
AU - Nassery, Afsaneh
AU - Ozev, Sule
AU - Verhelst, Marian
AU - Slamani, Mustapha
PY - 2011/8/29
Y1 - 2011/8/29
N2 - Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. Since EVM is analytically related to system impairments, which are typically measured in a production test environment, it can be eliminated from the test list if the relations between EVM and system impairments are derived in a manner that is independent of the circuit implementation and manufacturing process. In this paper, we focus on the WLAN standard, and derive the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems: IQ imbalance, non-linearity, and noise. Simulations and hardware experiments show that the accuracy of the analytical models is in par with a direct EVM measurement with a reasonable test time.
AB - Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. Since EVM is analytically related to system impairments, which are typically measured in a production test environment, it can be eliminated from the test list if the relations between EVM and system impairments are derived in a manner that is independent of the circuit implementation and manufacturing process. In this paper, we focus on the WLAN standard, and derive the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems: IQ imbalance, non-linearity, and noise. Simulations and hardware experiments show that the accuracy of the analytical models is in par with a direct EVM measurement with a reasonable test time.
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U2 - 10.1109/ETS.2011.46
DO - 10.1109/ETS.2011.46
M3 - Conference contribution
AN - SCOPUS:80051993830
SN - 9780769544335
T3 - Proceedings - 16th IEEE European Test Symposium, ETS 2011
SP - 75
EP - 80
BT - Proceedings - 16th IEEE European Test Symposium, ETS 2011
T2 - 16th IEEE European Test Symposium, ETS 2011
Y2 - 23 May 2011 through 27 May 2011
ER -