TY - GEN
T1 - Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers
AU - Acar, Erkan
AU - Ozev, Sule
AU - Redmond, Kevin B.
PY - 2006
Y1 - 2006
N2 - As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices is an appreciable percentage of the overall cost, which typically results from the high number of specifications, the high number of distinct test set-ups and equipment pieces that need to be used, and the high cost of each test set-up. In this paper, we investigate the versatility of EVM measurements to test the variable-envelope WLAN (Wireless Local Area Networks) receiver and transmitter characteristics. The goal is to optimize EVM test parameters (input data and test limits) and to reduce the number of specification measurements that require high test times and/or expensive test equipment. Our analysis shows that enhanced EVM measurements(optimized data sequence and limits, use of RMS, scale, and phase error vector values) in conjunction with a set of simple path measurements (input-output impedances) can provide the desired fault coverage while eliminating lengthy spectrum mask and noise figure tests
AB - As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices is an appreciable percentage of the overall cost, which typically results from the high number of specifications, the high number of distinct test set-ups and equipment pieces that need to be used, and the high cost of each test set-up. In this paper, we investigate the versatility of EVM measurements to test the variable-envelope WLAN (Wireless Local Area Networks) receiver and transmitter characteristics. The goal is to optimize EVM test parameters (input data and test limits) and to reduce the number of specification measurements that require high test times and/or expensive test equipment. Our analysis shows that enhanced EVM measurements(optimized data sequence and limits, use of RMS, scale, and phase error vector values) in conjunction with a set of simple path measurements (input-output impedances) can provide the desired fault coverage while eliminating lengthy spectrum mask and noise figure tests
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U2 - 10.1109/ICCAD.2006.320138
DO - 10.1109/ICCAD.2006.320138
M3 - Conference contribution
AN - SCOPUS:46149108831
SN - 1595933891
SN - 9781595933898
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 210
EP - 216
BT - Proceedings of the 2006 International Conference on Computer-Aided Design, ICCAD
T2 - 2006 International Conference on Computer-Aided Design, ICCAD
Y2 - 5 November 2006 through 9 November 2006
ER -