Disturbance-free BIST for loop characterization of DC-DC buck converters

Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Philippe Adell, Bert Vermeire, Bertan Bakkaloglu, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations


Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency. Unfortunately, they are also subject to higher process variations jeopardizing stable operation of the power supply. This paper presents a technique to track changes in the dynamic loop characteristics of the DC-DC converters without disturbing the normal mode of operation using a white noise based excitation and correlation. White noise excitation is generated via pseudo random disturbance at reference and PWM input of the converter with the test signal energy being spread over a wide bandwidth, below the converter noise and ripple floor. Test signal analysis is achieved by correlating the pseudo random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the-shelf power converter, LM27402 is used as the DUT for the experimental verification. Experimental results show that the proposed technique can estimate converter's natural frequency and Q-factor within ±2.5% and ±0.7% error margin respectively, over changes in load inductance and capacitance.

Original languageEnglish (US)
Title of host publicationProceedings - 2015 IEEE 33rd VLSI Test Symposium, VTS 2015
PublisherIEEE Computer Society
ISBN (Electronic)9781479975976
StatePublished - Jun 1 2015
Event2015 33rd IEEE VLSI Test Symposium, VTS 2015 - Napa, United States
Duration: Apr 27 2015Apr 29 2015

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Other2015 33rd IEEE VLSI Test Symposium, VTS 2015
Country/TerritoryUnited States

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering


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