Abstract
Flexible hybrid electronics have complex mechanical stress failure mechanisms. Researchers from ASU propose a novel method to obtain the optimum set of mechanical stress patterns to cover all potential fault locations and exert the required mechanical stress as dictated by the application.
Original language | English (US) |
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Article number | 8963916 |
Pages (from-to) | 35-41 |
Number of pages | 7 |
Journal | IEEE Design and Test |
Volume | 37 |
Issue number | 4 |
DOIs | |
State | Published - Aug 2020 |
Keywords
- COMSOL Multiphysics
- Flexible hybrid electronics
- integer linear programming
- stress
- test
ASJC Scopus subject areas
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering