Detailed characterization of transceiver parameters through loop-back-based BiST

Erdem S. Erdogan, Sule Ozev

Research output: Contribution to journalArticlepeer-review

42 Scopus citations


The impact of impairments such as transmitter/receiver I/Q gain/phase mismatch on the performance have become severe due to high operational speeds and continuous technology scaling. In this paper, we present a built-in-self-test (BiST) solution for quadrature modulation transceiver circuits using only transmitter and receiver baseband signals for test analysis. The mapping between transmitter input signals and receiver output signals are used to extract impairment and nonlinearity parameters separately with the help of the NLS method and detailed nonlinear system modeling. Experimental measurement results are in good agreement with the simulations and they confirm the high accuracy of the proposed method.

Original languageEnglish (US)
Article number5175281
Pages (from-to)901-911
Number of pages11
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number6
StatePublished - Jun 2010


  • Built-in-self-test (BiST)
  • I/Q mismatch
  • I/Q modulation
  • Nonlinearity
  • RF transceivers
  • Time skew

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering


Dive into the research topics of 'Detailed characterization of transceiver parameters through loop-back-based BiST'. Together they form a unique fingerprint.

Cite this