Abstract
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for automatic design of concurrent failure detection circuitry for linear analog systems is discussed in this paper. The desired hardware bound is specified as a constraint; the methodology aims at providing coverage in terms of all the circuit components while minimizing the loading overhead by reducing the number of internal circuit nodes that need to be tapped. Parameter tolerances are incorporated through either statistical or mathematical analysis to determine the threshold for failure alarm.
Original language | English (US) |
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Pages (from-to) | 756-765 |
Number of pages | 10 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 12 |
Issue number | 7 |
DOIs | |
State | Published - Jul 2004 |
Externally published | Yes |
Keywords
- Analog testing
- Design automation
- Online error detection
ASJC Scopus subject areas
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering