Delayed-RF based test development for FM transceivers using signature Analysis

Erkan Acar, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Scopus citations


We present an automatic test development methodology for FM transceivers based on frequency-domain signature analysis and delayed-RF set up. We develop two distinct pass/fail criteria based on eigensignatures and envelope signatures and a test generation algorithm that aims at minimizing the required delay while attaining full coverage of target faults. We develop a fault injection and simulation platform for a VCO-modulation, low-IF transceiver architecture using MATLAB and behavioral models including non-ideal response. The proposed methodology enables the automation of the test generation process, thus reduces the test development time. Experimental results have shown a 90% reduction in the required delay thereby reducing the cost of this test hardware item.

Original languageEnglish (US)
Title of host publicationProceedings - International Test Conference
Number of pages10
StatePublished - 2004
Externally publishedYes
EventProceedings - International Test Conference 2004 - Charlotte, NC, United States
Duration: Oct 26 2004Oct 28 2004


OtherProceedings - International Test Conference 2004
Country/TerritoryUnited States
CityCharlotte, NC

ASJC Scopus subject areas

  • General Engineering


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