TY - GEN
T1 - An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode
AU - Nassery, Afsaneh
AU - Ozev, Sule
PY - 2012
Y1 - 2012
N2 - Loop-back is a desirable test set-up for RF transceivers for both on-chip characterization and production testing. Measurement of IQ imbalances (phase mismatch, gain mismatch, DC offset, and time skews) in the loop-back mode is challenging due to the coupling between the receiver (RX) and transmitter (TX) parameters. We present an analytical method for the measurement of the imbalances in the loop-back mode. We excite the system with carefully designed test signals at the baseband TX input and analyze the corresponding RX baseband output. The derived and used mathematical equations based on these test inputs enable us to unambiguously compute IQ mismatches. Experiments conducted both in simulations and on a hardware platform confirm that the proposed technique can accurately compute the IQ imbalances.
AB - Loop-back is a desirable test set-up for RF transceivers for both on-chip characterization and production testing. Measurement of IQ imbalances (phase mismatch, gain mismatch, DC offset, and time skews) in the loop-back mode is challenging due to the coupling between the receiver (RX) and transmitter (TX) parameters. We present an analytical method for the measurement of the imbalances in the loop-back mode. We excite the system with carefully designed test signals at the baseband TX input and analyze the corresponding RX baseband output. The derived and used mathematical equations based on these test inputs enable us to unambiguously compute IQ mismatches. Experiments conducted both in simulations and on a hardware platform confirm that the proposed technique can accurately compute the IQ imbalances.
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U2 - 10.1109/date.2012.6176656
DO - 10.1109/date.2012.6176656
M3 - Conference contribution
AN - SCOPUS:84862096993
SN - 9783981080186
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1084
EP - 1089
BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
Y2 - 12 March 2012 through 16 March 2012
ER -