@article{f764a01c57844608a7a681f7857c222e,
title = "Adaptive test for RF/analog circuit using higher order correlations among measurements",
abstract = "As process variations increase and devices get more diverse in their behavior, using the same test list for all devices is increasingly inefficient. Methodologies that adapt the test sequence with respect to lot, wafer, or even a device's own behavior help contain the test cost while maintaining test quality. In adaptive test selection approaches, the initial test list, a set of tests that are applied to all devices to learn information, plays a crucial role in the quality outcome. Most adaptive test approaches select this initial list based on fail probability of each test individually. Such a selection approach does not take into account the correlations that exist among various measurements and potentially will lead to the selection of correlated tests. In this work, we propose a new adaptive test algorithm that includes a mathematical model for initial test ordering that takes correlations among measurements into account. The proposed method can be integrated within an existing test flow running in the background to improve not only the test quality but also the test time. Experimental results using four distinct industry circuits and large amounts of measurement data show that the proposed technique outperforms prior approaches considerably.",
keywords = "Fail rate, Higher order correlation, Initial test list, Marginality",
author = "Yanjun Li and Ender Yilmaz and Pete Sarson and Sule Ozev",
note = "Funding Information: This work is supported by the Fundamental Research Funds for the Central Universities, China. Project NO. ZYGX2016J220 and by National Science Foundation by the award number 1617562. Author{\textquoteright}s addresses: Y. Li, University of Electronic Science and Technology of China, CAE, Chengdu, Sichuan, China; email: yjli@uestc.edu.cn; E. Yilmaz, NXP Semiconductor, Austin, TX; email: ender.yilmaz@nxp.com; P. Sarson, Dialog Semiconductor, Swindon, UK; email: sarsonuk@gmail.com; S. Ozev, Arizona State University, Tempe, AZ; email: sule.ozev@asu.edu. Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from permissions@acm.org. {\textcopyright} 2019 Association for Computing Machinery. 1084-4309/2019/06-ART45 $15.00 https://doi.org/10.1145/3308566 Funding Information: This work is supported by National Science Foundation with Grant Number 1617562 and by Semiconductor Research Corporation by Task Number 2712.003. Publisher Copyright: {\textcopyright} 2019 Association for Computing Machinery.",
year = "2019",
month = jun,
doi = "10.1145/3308566",
language = "English (US)",
volume = "24",
journal = "ACM Transactions on Design Automation of Electronic Systems",
issn = "1084-4309",
publisher = "Association for Computing Machinery (ACM)",
number = "4",
}