TY - JOUR
T1 - A disturbance-free built-in self-test and diagnosis technique for DC-DC converters
AU - Shafiee, M.
AU - Beohar, N.
AU - Bakliwal, P.
AU - Roy, S.
AU - Mandal, D.
AU - Bakkaloglu, Bertan
AU - Ozev, Sule
N1 - Funding Information:
This work is jointly supported by Semiconductor Research Corporation, National Science Foundation, and Space Micro Inc. Authors wish to thank Philippe Adell from Nasa Jet Propulsion and Bert Vermeire from Space Micro Inc. for their support and providing insight and expertise that greatly assisted the research. Authors’ addresses: M. Shafiee and N. Beohar, School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287 USA; emails: {mshafiei, nvb}@asu.edu; P. Bakliwal and S. Roy, Intel Corp. Hillsboro, OR 97124 USA; emails: {priyanka.bakliwal, sidhanto.roy}@intel.com; D. Mandal, B. Bakkaloglu, and S. Ozev, School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287 USA; emails: {debashis.mandal, bertan.bakkaloglu, sule.ozev}@asu.edu. Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]. © 2017 ACM 1084-4309/2017/12-ART25 $15.00 http://dx.doi.org/10.1145/3152157
Publisher Copyright:
© 2017 ACM.
Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2017/12
Y1 - 2017/12
N2 - Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High-frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency and smaller form factor. Unfortunately, they are also subject to higher process variations, and faster in-field degradation, jeopardizing stable operation of the power supply. This article presents a technique to track changes in the dynamic loop characteristics of DC-DC converters without disturbing the normal mode of operation using a white noise-based excitation and correlation. Using multiple points for injection and analysis, we show that the degraded part can be diagnosed to take remedial action. White noise excitation is generated via a pseudo-random disturbance at reference, load current, and pulse-width modulation (PWM) nodes of the converter with the test signal energy being spread over a wide bandwidth, without significantly affecting the converter noise and ripple floor. The impulse response is extracted by correlating the random input sequence with the disturbed output generated. Test signal analysis is achieved by correlating the pseudo-random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the-shelf power converter, LM27402, is used as the device-under-test (DUT) for experimental verification. Experimental results show that the proposed technique can estimate converter natural frequency and quality factor (Q-factor) within ± 2.5% and ± 0.7% error margin respectively, over changes in load inductance and capacitance. For the diagnosis purpose, a measure of inductor's DC resistance (DCR) value, which is the inductor's series resistance and indicative of the degradation in inductor's Q-factor, is estimated within less than ± 1.6% error margin.
AB - Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High-frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency and smaller form factor. Unfortunately, they are also subject to higher process variations, and faster in-field degradation, jeopardizing stable operation of the power supply. This article presents a technique to track changes in the dynamic loop characteristics of DC-DC converters without disturbing the normal mode of operation using a white noise-based excitation and correlation. Using multiple points for injection and analysis, we show that the degraded part can be diagnosed to take remedial action. White noise excitation is generated via a pseudo-random disturbance at reference, load current, and pulse-width modulation (PWM) nodes of the converter with the test signal energy being spread over a wide bandwidth, without significantly affecting the converter noise and ripple floor. The impulse response is extracted by correlating the random input sequence with the disturbed output generated. Test signal analysis is achieved by correlating the pseudo-random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the-shelf power converter, LM27402, is used as the device-under-test (DUT) for experimental verification. Experimental results show that the proposed technique can estimate converter natural frequency and quality factor (Q-factor) within ± 2.5% and ± 0.7% error margin respectively, over changes in load inductance and capacitance. For the diagnosis purpose, a measure of inductor's DC resistance (DCR) value, which is the inductor's series resistance and indicative of the degradation in inductor's Q-factor, is estimated within less than ± 1.6% error margin.
KW - Built-In Self-Test
KW - DC DC buck converter
KW - Diagnosis method
KW - PRBS test method
KW - Stability
UR - http://www.scopus.com/inward/record.url?scp=85041432020&partnerID=8YFLogxK
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U2 - 10.1145/3152157
DO - 10.1145/3152157
M3 - Article
AN - SCOPUS:85041432020
SN - 1084-4309
VL - 23
JO - ACM Transactions on Design Automation of Electronic Systems
JF - ACM Transactions on Design Automation of Electronic Systems
IS - 2
M1 - 25
ER -