Variation-aware supply voltage assignment for simultaneous power and aging optimization

Xiaoming Chen, Yu Wang, Yu Cao, Yuchun Ma, Huazhong Yang

Research output: Contribution to journalArticlepeer-review

23 Scopus citations


As technology scales, negative bias temperature instability (NBTI) has become a major reliability concern for circuit designers. And the growing process variations can no longer be ignored. Meanwhile, reducing power consumption remains to be one of the design goals. In this paper, a variation-aware supply voltage assignment (SVA) technique combining dual V dd assignment and dynamic V dd scaling is proposed on a statistical platform, to minimize circuit power under an aging-aware timing constraint. The experimental results show that our SVA technique can mitigate on average 62% of the NBTI-induced circuit delay degradation. Compared with guard-banding and single V dd scaling approaches, our approach saves more energy.

Original languageEnglish (US)
Article number6042352
Pages (from-to)2143-2147
Number of pages5
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number11
StatePublished - 2012


  • Dynamic power
  • leakage power
  • negative bias temperature instability (NBTI)
  • supply voltage assignment (SVA)

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering


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