TY - JOUR
T1 - Using fixed and adaptive multivariate SPC charts for online SMD assembly monitoring
AU - Villalobos, J. René
AU - Muǹoz, Luis
AU - Gutierrez, Marco A.
N1 - Funding Information:
The authors would like to acknowledge the support provided by the National Science Foundation through grants DMI-9502897 and DMI-0300361 for the realization of this work. The authors also thank Vernon Dickson for his assistance in the preparation of the final manuscript of this paper.
Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2005/1/28
Y1 - 2005/1/28
N2 - This paper explores different alternatives for online monitoring of the assembly of surface mounted devices (SMD). The paper compares three widely used multivariate control charts: Hotelling, multivariate exponentially weighted moving average (MEWMA), and multivariate cumulative sum (MCUSUM). Two different scenarios are analyzed: one in which the sampling interval is fixed, and another in which the sampling interval is variable. The results presented in this paper are part of the development of an integrated quality environment for SMD assembly. For the first scenario, where fixed sampling intervals were used, MEWMA outperformed Hotelling and MCUSUM. That is, MEWMA was faster to detect shifts in the process mean. For the second scenario, where variable sampling intervals were used, only Hotelling was tested. The results showed that Hotelling with variable sampling intervals performed better than MEWMA with fixed sampling intervals.
AB - This paper explores different alternatives for online monitoring of the assembly of surface mounted devices (SMD). The paper compares three widely used multivariate control charts: Hotelling, multivariate exponentially weighted moving average (MEWMA), and multivariate cumulative sum (MCUSUM). Two different scenarios are analyzed: one in which the sampling interval is fixed, and another in which the sampling interval is variable. The results presented in this paper are part of the development of an integrated quality environment for SMD assembly. For the first scenario, where fixed sampling intervals were used, MEWMA outperformed Hotelling and MCUSUM. That is, MEWMA was faster to detect shifts in the process mean. For the second scenario, where variable sampling intervals were used, only Hotelling was tested. The results showed that Hotelling with variable sampling intervals performed better than MEWMA with fixed sampling intervals.
KW - Average run length
KW - Electronics assembly
KW - Multivariate control charts
KW - Statistical process control
KW - Variable sampling interval
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U2 - 10.1016/j.ijpe.2003.11.011
DO - 10.1016/j.ijpe.2003.11.011
M3 - Article
AN - SCOPUS:10444261255
SN - 0925-5273
VL - 95
SP - 109
EP - 121
JO - International Journal of Production Economics
JF - International Journal of Production Economics
IS - 1
ER -