Transmission electron microscopy of liquid phase densified SiC

Ray Carpenter, W. Braue, Raymond A. Cutler

    Research output: Contribution to journalArticlepeer-review

    13 Scopus citations


    Transmission electron microscopy was used to characterize microstructures of SiC densified using a transient liquid phase (resulting from the reaction of A12O3 with A14C3) by hot pressing at 1875 °C for 10 min in N2. High resolution electron microscopy showed that the SiC grain boundaries were free of glassy phases, suggesting that all liquid phases crystallized upon cooling. Phases that might be expected due to reactive sintering (i.e., AlN, Al2OC, A1203, Al4O4C, Al3OP3N, or solid solutions of SiC, AlN, and Al2OC) were not observed. However, significant Al, Si, O, and C concentrations were found at all triple junctions of these rapidly densified ceramics.

    Original languageEnglish (US)
    Pages (from-to)1937-1944
    Number of pages8
    JournalJournal of Materials Research
    Issue number9
    StatePublished - Sep 1991

    ASJC Scopus subject areas

    • General Materials Science
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering


    Dive into the research topics of 'Transmission electron microscopy of liquid phase densified SiC'. Together they form a unique fingerprint.

    Cite this