Transmission electron microscopy observations of magnetic multilayers

A. R. Modak, S. S P Parkin, David Smith

    Research output: Contribution to journalArticlepeer-review

    13 Scopus citations


    Transmission electron microscopy has been used for structural characterization of magnetic multilayers of particular interest because of their coupling behavior and giant magnetoresistance. Some case studies of multilayers, grown by DC magnetron sputtering, are presented and discussed. These include examples from the Co/Cu, NiFe/Cu and Fe/Co systems.

    Original languageEnglish (US)
    Pages (from-to)375-382
    Number of pages8
    Issue number4
    StatePublished - Dec 1992

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Instrumentation


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