Toward quantitative defect analysis using HREM

David Smith

Toward quantitative defect analysis using HREM

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Over the years, high resolution electron microscopy (HREM) has emerged as a very powerful tool for structure imaging and defect analysis of various materials. This can be attributed to HREM's ability to achieve results comparable to those obtained using structural models. The advent of advanced imaging techniques has also helped in narrowing the gap between modeled and measured results.

Original language	English (US)
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Editors	G.W. Bailey, A.J. Garratt-Reed
Pages	714-715
Number of pages	2
State	Published - 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

ASJC Scopus subject areas

Engineering(all)

Cite this

@inproceedings{67d1aeb7b9454d3cabfe957deb385061,

title = "Toward quantitative defect analysis using HREM",

abstract = "Over the years, high resolution electron microscopy (HREM) has emerged as a very powerful tool for structure imaging and defect analysis of various materials. This can be attributed to HREM's ability to achieve results comparable to those obtained using structural models. The advent of advanced imaging techniques has also helped in narrowing the gap between modeled and measured results.",

author = "David Smith",

year = "1994",

language = "English (US)",

pages = "714--715",

editor = "G.W. Bailey and A.J. Garratt-Reed",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

TY - GEN

T1 - Toward quantitative defect analysis using HREM

AU - Smith, David

PY - 1994

Y1 - 1994

N2 - Over the years, high resolution electron microscopy (HREM) has emerged as a very powerful tool for structure imaging and defect analysis of various materials. This can be attributed to HREM's ability to achieve results comparable to those obtained using structural models. The advent of advanced imaging techniques has also helped in narrowing the gap between modeled and measured results.

AB - Over the years, high resolution electron microscopy (HREM) has emerged as a very powerful tool for structure imaging and defect analysis of various materials. This can be attributed to HREM's ability to achieve results comparable to those obtained using structural models. The advent of advanced imaging techniques has also helped in narrowing the gap between modeled and measured results.

UR - http://www.scopus.com/inward/record.url?scp=0028737463&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028737463&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0028737463

SP - 714

EP - 715

BT - Proceedings - Annual Meeting, Microscopy Society of America

A2 - Bailey, G.W.

A2 - Garratt-Reed, A.J.

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -

Toward quantitative defect analysis using HREM

Abstract

Other

ASJC Scopus subject areas

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