With continuing growth in sensor capabilities and database complexity, the analysis and understanding of large data sets becomes increasingly important. Numerous researchers have recently explored the geometry and topology of high contrast patches in natural images in an attempt to understand the underlying manifold of the data. The results show that the majority of natural image patches are best represented by corners and edges, as one would expect from visual inspection. In this paper, we extend this analysis to log-magnitude SAR images from the MSTAR database. Our results show that the most representative high contrast patches in SAR images lie among the clutter however methods extracting target patches only show results more similar to that obtained for natural imagery. Contrary to their natural image counterparts however, high contrast patches in SAR imagery lack a significant geometric structure.

Original languageEnglish (US)
Title of host publication2010 IEEE Radar Conference
Subtitle of host publicationGlobal Innovation in Radar, RADAR 2010 - Proceedings
Number of pages5
StatePublished - 2010
EventIEEE International Radar Conference 2010, RADAR 2010 - Washington DC, United States
Duration: May 10 2010May 14 2010

Publication series

NameIEEE National Radar Conference - Proceedings
ISSN (Print)1097-5659


OtherIEEE International Radar Conference 2010, RADAR 2010
Country/TerritoryUnited States
CityWashington DC

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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