Abstract
Under some circumstances, the electronic and the vibrational properties of silica networks can be expressed in terms of the Connectivity Matrix. This matrix contains information about the connectivity of the network, and its properties are fairly well understood as a result of extensive studies on silicon networks. If the range of the overlap parameters becomes too large, this description breaks down and structural parameters such as the dihedral angle enter in an unavoidable way. In crystalline forms of silica, traditional band structure methods are far superior to this approach. However in comparing crystalline and vitreous silica, it is useful to have a common language when discussing the main features in the density of states. A detailed discussion is given for the oxygen 2s band in silica.
Original language | English (US) |
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Title of host publication | Unknown Host Publication Title |
Place of Publication | New York, NY |
Publisher | Pergamon Press |
Pages | 116-121 |
Number of pages | 6 |
State | Published - 1978 |
Externally published | Yes |
Event | Proc of the Int Top Conf on the Phys of SiO2 and its Interfaces - Yorktown Heights, NY, USA Duration: Mar 22 1978 → Mar 24 1978 |
Other
Other | Proc of the Int Top Conf on the Phys of SiO2 and its Interfaces |
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City | Yorktown Heights, NY, USA |
Period | 3/22/78 → 3/24/78 |
ASJC Scopus subject areas
- Engineering(all)