@inproceedings{13f67cd6f09e4ecea01a922f15c12608,
title = "Three-dimensional x-ray diffraction nanoscopy",
abstract = "A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.",
keywords = "3D diffraction, Coherent x-rays, Imaging, Nano-structures, Phase-retrieval",
author = "Nikulin, {Andrei Y.} and Dilanian, {Ruben A.} and Zatsepin, {Nadia A.} and Muddle, {Barry C.}",
year = "2008",
doi = "10.1117/12.795955",
language = "English (US)",
isbn = "9780819472625",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Instrumentation, Metrology, and Standards for Nanomanufacturing II",
note = "Instrumentation, Metrology, and Standards for Nanomanufacturing II ; Conference date: 10-08-2008 Through 10-08-2008",
}