Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin, Ruben A. Dilanian, Nadia A. Zatsepin, Barry C. Muddle

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

Original languageEnglish (US)
Title of host publicationInstrumentation, Metrology, and Standards for Nanomanufacturing II
StatePublished - 2008
Externally publishedYes
EventInstrumentation, Metrology, and Standards for Nanomanufacturing II - San Diego, CA, United States
Duration: Aug 10 2008Aug 10 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherInstrumentation, Metrology, and Standards for Nanomanufacturing II
Country/TerritoryUnited States
CitySan Diego, CA


  • 3D diffraction
  • Coherent x-rays
  • Imaging
  • Nano-structures
  • Phase-retrieval

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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