Thermionic FEEM, PEEM and I/V measurements of N-doped CVD diamond surfaces

F. A M Köck, J. M. Garguilo, B. Brown, Robert Nemanich

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


Imaging of field emission and photoemission from diamond surfaces is accomplished with a high resolution photo-electron emission microscope (PEEM). Measurements obtained as a function of sample temperature up to 1000°C display thermionic field emission images (T-FEEM). The system can also record the emission current versus applied voltage. N-doped diamond films have been produced by MPCVD with a N/C gas phase ratio of 48. The surfaces display uniform emission in PEEM at all temperatures. No FEEM images are detectable below 500°C. At ∼680°C the T-FEEM and PEEM images are nearly identical in intensity and uniformity. This is to be contrasted with other carbon based cold cathodes in which the emission is observed from only a low density of highly emitting sites. The I/V measurements obtained from the N-doped films in the T-FEEM configuration show a component that depends linearly on voltage at low fields. At higher fields, an approximately exponential dependence is observed. At low temperatures employed (<700°C), the results indicate a thermionic component to the emitted current.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsK.L. Jensen, R.J. Nemanich, P. Holloway, T. Trottier, W. Mackie
StatePublished - 2000
Externally publishedYes
EventElectron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays - San Francisco, CA, United States
Duration: Apr 25 2000Apr 27 2000


OtherElectron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays
Country/TerritoryUnited States
CitySan Francisco, CA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials


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