The impact of correlation between NBTI and TDDB on the performance of digital circuits

Hong Luo; Yu Wang; Jyothi Velamala; Yu Cao; Yuan Xie; Huazhong Yang

doi:10.1109/MWSCAS.2011.6026408

The impact of correlation between NBTI and TDDB on the performance of digital circuits

Hong Luo, Yu Wang, Jyothi Velamala, Yu Cao, Yuan Xie, Huazhong Yang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

Abstract

With integrated circuits scale into the nano-scale era, aging effect becomes one of the most important design challenges. Both the biased temperature instability (BTI) and time-dependent dielectric breakdown (TDDB) can significantly degrade the performance of the circuits. In this paper, we consider the correlation between BTI and TDDB, and apply the correlation model to digital circuit analysis for the first time. The results show that the correlation can lead to 10.42% further more delay degradation.

Original language	English (US)
Title of host publication	54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011
DOIs	https://doi.org/10.1109/MWSCAS.2011.6026408
State	Published - Oct 13 2011
Event	54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011 - Seoul, Korea, Republic of Duration: Aug 7 2011 → Aug 10 2011

Publication series

Name	Midwest Symposium on Circuits and Systems
ISSN (Print)	1548-3746

Other

Other	54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011
Country/Territory	Korea, Republic of
City	Seoul
Period	8/7/11 → 8/10/11

Keywords

Aging
BTI
Correlation
TDDB

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/MWSCAS.2011.6026408

Cite this

Luo, H, Wang, Y, Velamala, J, Cao, Y, Xie, Y & Yang, H 2011, The impact of correlation between NBTI and TDDB on the performance of digital circuits. in 54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011., 6026408, Midwest Symposium on Circuits and Systems, 54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011, Seoul, Korea, Republic of, 8/7/11. https://doi.org/10.1109/MWSCAS.2011.6026408

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title = "The impact of correlation between NBTI and TDDB on the performance of digital circuits",

abstract = "With integrated circuits scale into the nano-scale era, aging effect becomes one of the most important design challenges. Both the biased temperature instability (BTI) and time-dependent dielectric breakdown (TDDB) can significantly degrade the performance of the circuits. In this paper, we consider the correlation between BTI and TDDB, and apply the correlation model to digital circuit analysis for the first time. The results show that the correlation can lead to 10.42% further more delay degradation.",

keywords = "Aging, BTI, Correlation, TDDB",

author = "Hong Luo and Yu Wang and Jyothi Velamala and Yu Cao and Yuan Xie and Huazhong Yang",

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AU - Yang, Huazhong

PY - 2011/10/13

Y1 - 2011/10/13

N2 - With integrated circuits scale into the nano-scale era, aging effect becomes one of the most important design challenges. Both the biased temperature instability (BTI) and time-dependent dielectric breakdown (TDDB) can significantly degrade the performance of the circuits. In this paper, we consider the correlation between BTI and TDDB, and apply the correlation model to digital circuit analysis for the first time. The results show that the correlation can lead to 10.42% further more delay degradation.

AB - With integrated circuits scale into the nano-scale era, aging effect becomes one of the most important design challenges. Both the biased temperature instability (BTI) and time-dependent dielectric breakdown (TDDB) can significantly degrade the performance of the circuits. In this paper, we consider the correlation between BTI and TDDB, and apply the correlation model to digital circuit analysis for the first time. The results show that the correlation can lead to 10.42% further more delay degradation.

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The impact of correlation between NBTI and TDDB on the performance of digital circuits

Abstract

Publication series

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Keywords

ASJC Scopus subject areas

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