The Impact of Artificial Intelligence on In Situ Electron Microscopy

Peter A. Crozier; Adrià Marcos Morales; Matan Leibovich; Sreyas Mohan; Piyush Haluai; Mai Tan; Joshua Vincent; Advait Gilankar; Yifan Wang; Carlos Fernandez-Granda

doi:10.1093/micmic/ozad067.1105

The Impact of Artificial Intelligence on In Situ Electron Microscopy

Peter A. Crozier, Adrià Marcos Morales, Matan Leibovich, Sreyas Mohan, Piyush Haluai, Mai Tan, Joshua Vincent, Advait Gilankar, Yifan Wang, Carlos Fernandez-Granda

Engineering, Ira A. Fulton Schools of (IAFSE)

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Original language	English (US)
Pages (from-to)	1595-1596
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.1105
State	Published - Jul 22 2023

ASJC Scopus subject areas

Instrumentation

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10.1093/micmic/ozad067.1105

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title = "The Impact of Artificial Intelligence on In Situ Electron Microscopy",

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AU - Crozier, Peter A.

AU - Morales, Adrià Marcos

AU - Leibovich, Matan

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AU - Tan, Mai

AU - Vincent, Joshua

AU - Gilankar, Advait

AU - Wang, Yifan

AU - Fernandez-Granda, Carlos

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The Impact of Artificial Intelligence on In Situ Electron Microscopy

ASJC Scopus subject areas

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