Abstract
Ferroelectric (FE) thin-film capacitors were irradiated to 100 Mrad(Si) with 10-keV x rays. Some of the FE hysteresis loops show distortion at 5 Mrad(Si). The type and degree of distortion is dependent upon the polarization state and/or the applied field during irradiation. Preliminary results indicate that a fraction of the radiation-induced damage can be removed simply by cycling the FE capacitor with a 20-Khz square wave. The amount of damage removed is dependent upon the radiation conditions.
Original language | English (US) |
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Pages (from-to) | 1713-1717 |
Number of pages | 5 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 37 |
Issue number | 6 |
DOIs | |
State | Published - Dec 1990 |
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering