TY - JOUR
T1 - Temperature and pump power dependent photoluminescence characterization of MBE grown GaAsBi on GaAs
AU - Riordan, Nathaniel A.
AU - Gogineni, Chaturvedi
AU - Johnson, Shane
AU - Lu, Xianfeng
AU - Tiedje, Tom
AU - Ding, Ding
AU - Zhang, Yong-Hang
AU - Fritz, Rafael
AU - Kolata, Kolja
AU - Chatterjee, Sangam
AU - Volz, Kerstin
AU - Koch, Stephan W.
N1 - Funding Information:
Acknowledgments We gratefully acknowledge financial support through the National Science Foundation award DMR-0909028, the Natural Sciences and Engineering Research Council of Canada, the Deutsche Forschungsgemeinschaft (German Research Foundation), and the Materials World Network: III–V Bismide Materials for IR and Mid IR Semiconductors.
Copyright:
Copyright 2012 Elsevier B.V., All rights reserved.
PY - 2012/10
Y1 - 2012/10
N2 - Bulk and quantum well GaAs 1-xBi x/GaAs layers with Bi mole fractions from 0.02 to 0.10 are grown by molecular-beam epitaxy at temperatures ranging from 280 to 320 °C. The samples are characterized using temperature and pump-power dependent photoluminescence measurements covering 8-300 K and 1-250 mW (7-1,800 W/cm 2), respectively. The results indicate that there is strong reduction in bandgap energy with the incorporation of small amounts of Bi and that GaAsBi most likely forms a weak type-I band alignment with GaAs.
AB - Bulk and quantum well GaAs 1-xBi x/GaAs layers with Bi mole fractions from 0.02 to 0.10 are grown by molecular-beam epitaxy at temperatures ranging from 280 to 320 °C. The samples are characterized using temperature and pump-power dependent photoluminescence measurements covering 8-300 K and 1-250 mW (7-1,800 W/cm 2), respectively. The results indicate that there is strong reduction in bandgap energy with the incorporation of small amounts of Bi and that GaAsBi most likely forms a weak type-I band alignment with GaAs.
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U2 - 10.1007/s10854-012-0665-1
DO - 10.1007/s10854-012-0665-1
M3 - Article
AN - SCOPUS:84867246642
SN - 0957-4522
VL - 23
SP - 1799
EP - 1804
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 10
ER -