Taking atomic force microscope advances to the university classroom

J. D. Adams, G. Priyadarshan, A. Mabogunje, L. J. Leifer, C. F. Quate, E. W. Ong, B. L. Ramakrishna

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


The initial findings of a case study conducted on a group of students undergoing a one-semester course on cutting-edge atomic force microscopy (AFM) research are presented. The course included the most recent advances in building high throughput AFMs and had a positive student response. The findings highlighted the potential of using AFM as the focus of a micro-electro-mechanical devices (MEMS)/nanotechnology course for university students.

Original languageEnglish (US)
Title of host publicationIEEE Aerospace Conference Proceedings
Number of pages10
StatePublished - 2001
Externally publishedYes
Event2001 IEEE Aerospace Conference - Big Sky, MT, United States
Duration: Mar 10 2001Mar 17 2001


Other2001 IEEE Aerospace Conference
Country/TerritoryUnited States
CityBig Sky, MT

ASJC Scopus subject areas

  • Aerospace Engineering


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