Abstract
Stoichiometric SiGe and Si4Ge epitaxial films and coherent islands are created on Si(100) via thermal dehydrogenation of H 3SiGeH3 and Ge-(SiH3)4, respectively. The control of morphology and composition x of Si 1-xGex nanostructures at the atomic level is achieved for the first time via CVD growth of single-source precursors containing precise atomic arrangements with direct Si-Ge bonds.
Original language | English (US) |
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Pages (from-to) | 3569-3572 |
Number of pages | 4 |
Journal | Chemistry of Materials |
Volume | 15 |
Issue number | 19 |
DOIs | |
State | Published - Sep 23 2003 |
ASJC Scopus subject areas
- Chemistry(all)
- Chemical Engineering(all)
- Materials Chemistry