Abstract
Surface stress represents the reversible work per unit area to elastically stretch a solid surface, and can be associated with interfaces between two solid phases as well as free solid surfaces. The effects of surface stresses on the critical thickness for epitaxy in thin film superlattices is given.
| Original language | English (US) |
|---|---|
| Title of host publication | Materials Research Society Symposium - Proceedings |
| Editors | R.L. Crane, J.D. Achenbach, S.P. Shah, T.E. Matikas, P. Khuri-Yakub, R.S. Gilmore |
| Publisher | MRS |
| Pages | 475-479 |
| Number of pages | 5 |
| Volume | 505 |
| State | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of the 1997 MRS Fall Meeting - Boston, MA, USA Duration: Nov 30 1997 → Dec 4 1997 |
Other
| Other | Proceedings of the 1997 MRS Fall Meeting |
|---|---|
| City | Boston, MA, USA |
| Period | 11/30/97 → 12/4/97 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials