Surface imaging of III-V semiconductors by reflection electron microscopy and inner potential measurements

Engineering & Materials Science

• III-V semiconductors 100%
• Electron microscopy 78%
• Imaging techniques 46%
• Plasmons 26%
• Surface plasmons 24%
• Diffraction patterns 21%
• Electron diffraction 19%
• Diffraction 16%
• Electrons 15%
• Semiconductor materials 13%
• Energy dissipation 12%

Chemical Compounds

• Electron Microscopy 52%
• Reflection 47%
• Semiconductor 45%
• Surface 19%
• Surface Plasmon 17%
• Plasmon 17%
• Electron Diffraction 15%
• Electron Particle 8%
• Energy 7%

Physics & Astronomy

• electron microscopy 51%
• spatial resolution 23%
• electron diffraction 12%
• diffraction patterns 12%
• plasmons 12%
• penetration 12%
• energy dissipation 12%
• electron energy 11%
• interference 10%
• high resolution 9%
• diffraction 8%