TY - GEN
T1 - Summary of In-Parameter-Order strategies for covering perfect hash families
AU - Wagner, Michael
AU - Colbourn, Charles J.
AU - Simos, Dimitris E.
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Generating combinatorial test sets for complex systems, where the input model contains hundreds or thousands of parameters is a very challenging task. In [1], we developed a new approach that performs this task very effectively by modifying the popular In-Parameter-Order (IPO) strategy to generate a combinatorial structure called Covering Perfect Hash Families (CPHFs), which can be seen as an efficient packing of certain families of Covering Arrays (CAs). The introduced methods not only manage to generate CAs with a large number of columns within a short amount of time, in many cases the produced CAs are smaller than the previously best known ones.
AB - Generating combinatorial test sets for complex systems, where the input model contains hundreds or thousands of parameters is a very challenging task. In [1], we developed a new approach that performs this task very effectively by modifying the popular In-Parameter-Order (IPO) strategy to generate a combinatorial structure called Covering Perfect Hash Families (CPHFs), which can be seen as an efficient packing of certain families of Covering Arrays (CAs). The introduced methods not only manage to generate CAs with a large number of columns within a short amount of time, in many cases the produced CAs are smaller than the previously best known ones.
KW - Algorithms
KW - Covering Array
KW - Covering Perfect Hash Families
KW - In-Parameter-Order
KW - Permutation Vector
UR - http://www.scopus.com/inward/record.url?scp=85163096741&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85163096741&partnerID=8YFLogxK
U2 - 10.1109/ICSTW58534.2023.00055
DO - 10.1109/ICSTW58534.2023.00055
M3 - Conference contribution
AN - SCOPUS:85163096741
T3 - Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
SP - 268
EP - 270
BT - Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
Y2 - 16 April 2023 through 20 April 2023
ER -