Sub-10 fs RMS measurement of X-ray/optical delay

M. R. Bionta, J. P. Cryan, J. M. Glownia, D. French, C. Bostedt, M. Cammarrata, J. C. Castagna, Y. Ding, S. M. Durbin, Y. Feng, A. R. Fry, D. J. Kane, J. Krzywinski, H. T. Lemke, M. Messerschmidt, A. Natan, D. F. Ratner, S. Schorb, M. L. Swiggers, M. TrigoW. E. White, R. N. Coffee

Research output: Chapter in Book/Report/Conference proceedingConference contribution


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