Abstract
The Synergistic effect between Total Ionizing Dose (TID) and Analog Transient Radiation Effects in Electronics (ATREE) in an operational amplifier (LM124) is investigated. A predictive methodology, based on a previously developed ATREEs simulation tool, is used to model the synergistic phenomena. This phenomenon is simulated for the first time and the duration of the ATREEs' is found to be identical to those measured experimentally. ATREEs induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in the LM124 operational amplifier configured in three different bias configurations are investigated and simulated.
Original language | English (US) |
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Article number | 6084769 |
Pages (from-to) | 2890-2897 |
Number of pages | 8 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 58 |
Issue number | 6 PART 1 |
DOIs | |
State | Published - Dec 2011 |
Keywords
- Bipolar analog integrated circuits
- integrated circuit modeling
- ionizing dose
- single event transient
- transient propagation
- transient radiation effects
- transient response
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering