Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier

Nicolas J.H. Roche, Stephanie Perez, Julien Mekki, Y. Gonzalez Velo, Laurent Dusseau, Jérme Boch, Jean Roch Vaille, Frédéric Saigne, Ronan Marec, Philippe Calvel, Francoise Bezerra, Gérard Auriel, Bruno Azais, Stephen P. Buchner

Research output: Contribution to journalArticlepeer-review

15 Scopus citations


The Synergistic effect between Total Ionizing Dose (TID) and Analog Transient Radiation Effects in Electronics (ATREE) in an operational amplifier (LM124) is investigated. A predictive methodology, based on a previously developed ATREEs simulation tool, is used to model the synergistic phenomena. This phenomenon is simulated for the first time and the duration of the ATREEs' is found to be identical to those measured experimentally. ATREEs induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in the LM124 operational amplifier configured in three different bias configurations are investigated and simulated.

Original languageEnglish (US)
Article number6084769
Pages (from-to)2890-2897
Number of pages8
JournalIEEE Transactions on Nuclear Science
Issue number6 PART 1
StatePublished - Dec 2011


  • Bipolar analog integrated circuits
  • integrated circuit modeling
  • ionizing dose
  • single event transient
  • transient propagation
  • transient radiation effects
  • transient response

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering


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