Strucuture of low loss EELS in Hf and Zr metal, dioxides and silicates

R. Shivaraman, Andrew Chizmeshya, Sandwip Dey, Ray Carpenter

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)14-15
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 2008

ASJC Scopus subject areas

  • Instrumentation

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