STRUCTURE OF EXTENDED DEFECT TERMINATIONS IN RUTILE.

David J. Smith; L. A. Bursill; M. G. Blanchin

STRUCTURE OF EXTENDED DEFECT TERMINATIONS IN RUTILE.

David J. Smith, L. A. Bursill, M. G. Blanchin

Research output: Contribution to journal › Article › peer-review

Abstract

High-resolution electron microscopy (HREM) has been used to reveal directly the nature of the termination of crystallographic shear planes (CSPs) in single crystals of reduced rutile. Two types of CSP precipitate on cooling specimens across the TiO//2// minus //x phase boundary. Single (132) CSPs have an extrinsic displacement vector of about one-half LT AN BR 011 OVER BAR RT AN BR , whereas pairs of CSPs have approximately zero net displacement vector, as determined by drawing Burgers circuits directly onto the HREM images. The precipitation mechanism is explained readily in terms of the aggregation of linear cationic interstitial defects. Refs.

Original language	English (US)
Pages (from-to)	473-485
Number of pages	13
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	50
Issue number	4
State	Published - Jan 1 1984
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Materials Science(all)
Condensed Matter Physics
Physics and Astronomy (miscellaneous)
Metals and Alloys

Cite this

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title = "STRUCTURE OF EXTENDED DEFECT TERMINATIONS IN RUTILE.",

abstract = "High-resolution electron microscopy (HREM) has been used to reveal directly the nature of the termination of crystallographic shear planes (CSPs) in single crystals of reduced rutile. Two types of CSP precipitate on cooling specimens across the TiO//2// minus //x phase boundary. Single (132) CSPs have an extrinsic displacement vector of about one-half LT AN BR 011 OVER BAR RT AN BR , whereas pairs of CSPs have approximately zero net displacement vector, as determined by drawing Burgers circuits directly onto the HREM images. The precipitation mechanism is explained readily in terms of the aggregation of linear cationic interstitial defects. Refs.",

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N2 - High-resolution electron microscopy (HREM) has been used to reveal directly the nature of the termination of crystallographic shear planes (CSPs) in single crystals of reduced rutile. Two types of CSP precipitate on cooling specimens across the TiO//2// minus //x phase boundary. Single (132) CSPs have an extrinsic displacement vector of about one-half LT AN BR 011 OVER BAR RT AN BR , whereas pairs of CSPs have approximately zero net displacement vector, as determined by drawing Burgers circuits directly onto the HREM images. The precipitation mechanism is explained readily in terms of the aggregation of linear cationic interstitial defects. Refs.

AB - High-resolution electron microscopy (HREM) has been used to reveal directly the nature of the termination of crystallographic shear planes (CSPs) in single crystals of reduced rutile. Two types of CSP precipitate on cooling specimens across the TiO//2// minus //x phase boundary. Single (132) CSPs have an extrinsic displacement vector of about one-half LT AN BR 011 OVER BAR RT AN BR , whereas pairs of CSPs have approximately zero net displacement vector, as determined by drawing Burgers circuits directly onto the HREM images. The precipitation mechanism is explained readily in terms of the aggregation of linear cationic interstitial defects. Refs.

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ER -

STRUCTURE OF EXTENDED DEFECT TERMINATIONS IN RUTILE.

Abstract

ASJC Scopus subject areas

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