Strain analysis of InxGa(1-x)N/GaN films by CBIM toward quantification

Strain analysis of In_xGa_(1-x)N/GaN films by CBIM toward quantification

B. Jiang, L. J. Geng, Fernando Ponce, John Spence

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	860-861
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
State	Published - Sep 4 2003

@article{0d2bd812217b4a1a9ddde5311ba713b5,

title = "Strain analysis of InxGa(1-x)N/GaN films by CBIM toward quantification",

author = "B. Jiang and Geng, {L. J.} and Fernando Ponce and John Spence",

year = "2003",

month = sep,

day = "4",

language = "English (US)",

volume = "9",

pages = "860--861",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Strain analysis of InxGa(1-x)N/GaN films by CBIM toward quantification

AU - Jiang, B.

AU - Geng, L. J.

AU - Ponce, Fernando

AU - Spence, John

PY - 2003/9/4

Y1 - 2003/9/4

UR - http://www.scopus.com/inward/record.url?scp=0041920929&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0041920929&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0041920929

SN - 1431-9276

VL - 9

SP - 860

EP - 861

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -