@inproceedings{fcb5195b728a46cfbb1f4a4f74ef125e,
title = "Statistical assessment methodology for the design and optimization of cross-point RRAM arrays",
abstract = "A comprehensive assessment methodology for the design and optimization of cross-point resistive random access memory (RRAM) arrays is developed based on a simulation platform implementing an RRAM SPICE model with intrinsic variation effects. A statistical assessment of write/read functionality and circuit reliability is performed via quantifying the impact of array-level variations on RRAM memory circuits. Operation reliability including write failure probability and write disturb effect is quantified, with a strategy of choosing bias schemes and a Vdd design tradeoff presented. Circuit/device co-design guidelines and requirements are further extracted based on the assessment of a series of figure-of-merits such as energy-delay product, disturb immunity, and interconnect scaling effect. Finally, an optimized cross-point array configuration is designed to boost circuit performance. The developed assessment flow will pave the way towards robust circuit/device co-design.",
keywords = "Resistive random access memory (RRAM), cross-point array, optimization, statistical assessment, variation",
author = "Haitong Li and Zizhen Jiang and Peng Huang and Chenl, {Hong Yu} and Bing Chen and Rui Liu and Zhe Chen and Feifei Zhang and Lifeng Liu and Bin Gao and Xiaoyan Liu and Shimeng Yu and Wong, {H. S Philip} and Jinfeng Kang",
year = "2014",
doi = "10.1109/IMW.2014.6849357",
language = "English (US)",
isbn = "9781479935949",
series = "2014 IEEE 6th International Memory Workshop, IMW 2014",
publisher = "IEEE Computer Society",
booktitle = "2014 IEEE 6th International Memory Workshop, IMW 2014",
note = "2014 IEEE 6th International Memory Workshop, IMW 2014 ; Conference date: 18-05-2014 Through 21-05-2014",
}