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Dive into the research topics of 'Statistical analysis of the impact of charge traps in p-type MOSFETs via particle-based Monte Carlo device simulations'. Together they form a unique fingerprint.- Sort by
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Alan C.J. Rossetto, Vinicius V.A. Camargo, Thiago H. Both, Dragica Vasileska, Gilson I. Wirth
Research output: Contribution to journal › Article › peer-review