Standard Instrument Configuration For Parametric Testing

A. J. Walton, J. M. Robertson, R. Holwill, M. B. Moore

Research output: Contribution to journalArticlepeer-review


A standard configuration for parametric test structures is proposed which can then be measured using instrumentation which is hardwired to the probes. The appropriate connections are made on-chip, which significantly reduces the complexity and expense of the measurement system.

Original languageEnglish (US)
Pages (from-to)127-128
Number of pages2
JournalElectronics Letters
Issue number4
StatePublished - Jan 1 1985


  • Instrumentation
  • Measurement

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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